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Aptitude™ Parametric Tester

All specifications are subject to change without notice.

The Aptitude Parametric Tester allows customers to test all the fundamental characteristics of the micro modules before they are connected to an antenna. The tester has the ability to test micromodules compliant with 14443 standard for both type A & B.

For Laboratory Use

The Aptitude Parametric Tester comes complete with dedicated analysis software and includes:

1. Input capacitance measurement form 10 pF to 200pF (accuracy < 1pF)
2. Variation of capacitance depending on voltage variation (from 0 up to 20 Vpp) and frequency variation (from 1 Mhz to 20 MHz)
3. Minimal tension of operation measurement
4. Power on reset time of measurement
5. Test of the micro module capability to answer to the main type A & B instructions
6. Modulation factor measurement

For Production Use

The Aptitude Parametric Tester is also available in a rack version with up to 8 boards inside. In this configuration, the tester can be connected to a prober for wafer testing or connected to the Aptitude MTH-C Test Handler for micro modules on film testing. Several racks can be connected and synchronized giving you the flexibility to accommodate your current and future needs.

The Aptitude Parametric Tester ensures that that both laboratory and production sites have the identical reference of test. Customers can now enjoy the comfort of consistent and reliable test results, whether in the lab or on the production floor.

The Aptitude Parametric Tester is part of our Aptitude Suite of products for smart card production. Consult your NBS representative for complete details on all of our smart card manufacturing solutions.

Features

1. applicable to both laboratory and production sites
2. high speed and high accuracy system for the testing of ISO 14443 type A & B micro module on film and chips on wafer
3. tests the parametric and functional features of the object’s RF interface